Manuscript X-D-ST@1 · X-D-ST.tex · section · e0cf8fdb

A recalled identity with an explicit representative

Gauge passage and the defect ledger › A recalled identity with an explicit representative · lines 1425–1443

X-D-ST@1#eq:defects

The X-C-ST three-term variation can be stated entirely at test level. Let

E [q] = P_{m} + L [q], s_{ε} [q] = E_{A} e_{ε} [q],

and define

Θ_{F, ε} [q] Σ_{F} [q] = c_{ε} [q^{'}] - F^{♯} c_{ε} [q], = E [q^{'}] F^{*} - F^{♯} E [q] .

The switch defect $Σ_{F}$ is independent of the ramp width.

Displayed formulas in this passage

X-D-ST@1#eq:defects · line 1433
$Θ_{F, ε} [q] Σ_{F} [q] = c_{ε} [q^{'}] - F^{♯} c_{ε} [q], = E [q^{'}] F^{*} - F^{♯} E [q] .$
unlabeled · line 1429
$E [q] = P_{m} + L [q], s_{ε} [q] = E_{A} e_{ε} [q],$