Manuscript XX-F@1 · XX-F.tex · section · de0bd24f

Subsidiary defect and simultaneous repair

Admissible images: insertion and operation changes › Subsidiary defect and simultaneous repair · lines 1371–1394

Retain the free mixed defect

D_{sub} = - K W_{Q} - r W F^{†} .

For real symmetric smooth bisolution changes,

D_{sub} ⟼ D_{sub} - (K S_{Q} + r S_{B} F^{†}) .

Its smoothness does not imply either vanishing or compatibility with the native infrared domain.

Suppose the calculated combined correction map is

M : C ⟶ V_{break} \oplus V_{sub}, M c = (L c, T c) .

Its targets are the actual complete defects, with all tests and retained coefficients included.

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